The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Nov. 21, 2022
Datarobot, Inc., Boston, MA (US);
Sindhu Ghanta, San Mateo, CA (US);
Bharath Ramsundar, Fremont, CA (US);
Drew Roselli, Woodinville, WA (US);
Nisha Talagala, Saratoga, CA (US);
Vinay Sridhar, San Jose, CA (US);
Swaminathan Sundararaman, San Jose, CA (US);
Lior Amar, Sunnyvale, CA (US);
Lior Khermosh, Palo Alto, CA (US);
Sriram Subramanian, Dallas, TX (US);
DataRobot, Inc., Boston, MA (US);
Abstract
Apparatuses, systems, program products, and method are disclosed for detecting suitability of machine learning models for datasets. An apparatus includes a training evaluation module configured to calculate a first statistical data signature for a training data set of a machine learning system using one or more predefined statistical algorithms. An apparatus includes an inference evaluation module configured to calculate a second statistical data signature for an inference data set of a machine learning system using one or more predefined statistical algorithms. An apparatus includes a score module configured to calculate a suitability score describing the suitability of a training data set to an inference data set as a function of a first and a second statistical data signature. An apparatus includes an action module configured to perform an action related to a machine learning system in response to a suitability score satisfying an unsuitability threshold.