The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Oct. 21, 2019
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Shean Wang, Sammamish, WA (US);
Jiayuan Huang, Medina, WA (US);
Weizhu Chen, Kirkland, WA (US);
Changhong Yuan, Sammamish, WA (US);
Ankit Saraf, Bellevue, WA (US);
Xiaoying Guo, Sammamish, WA (US);
Eslam K. Abdelreheem, Sammamish, WA (US);
Yunjing Ma, Bellevue, WA (US);
Yuantao Wang, Sammamish, WA (US);
Justin Carl Wong, Seattle, WA (US);
Nan Zhao, Sammamish, WA (US);
Chao Li, Kirkland, WA (US);
Tsuyoshi Watanabe, Bothell, WA (US);
Jaclyn Ruth Elizabeth Phillips, Seattle, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
In some examples, iterative sampling based dataset clustering may include sampling a dataset that includes a plurality of items to identify a specified number of sampled items. The sampled items may be clustered to generate a plurality of clusters. Un-sampled items may be assigned from the plurality of items to the clusters. Remaining un-sampled items that are not assigned to the clusters may be identified. A ratio associated with the remaining un-sampled items and the plurality of items may be compared to a specified threshold. Based on a determination that the ratio is greater than the specified threshold, an indication of completion of clustering of the plurality of items may be generated.