The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
May. 06, 2020
Applicant:
View, Inc., Milpitas, CA (US);
Inventor:
Robert T. Rozbicki, Los Gatos, CA (US);
Assignee:
View Operating Corporation, San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/153 (2006.01); C23C 14/02 (2006.01); C23C 14/06 (2006.01); C23C 14/08 (2006.01); C23C 14/34 (2006.01); C23C 14/58 (2006.01); G02F 1/13 (2006.01); G02F 1/1333 (2006.01); G02F 1/1523 (2019.01); G02F 1/1524 (2019.01); G02F 1/155 (2006.01); H01J 37/32 (2006.01); H01J 37/34 (2006.01);
U.S. Cl.
CPC ...
G02F 1/153 (2013.01); C23C 14/021 (2013.01); C23C 14/028 (2013.01); C23C 14/0635 (2013.01); C23C 14/0652 (2013.01); C23C 14/0676 (2013.01); C23C 14/08 (2013.01); C23C 14/081 (2013.01); C23C 14/083 (2013.01); C23C 14/086 (2013.01); C23C 14/34 (2013.01); C23C 14/588 (2013.01); C23C 14/5886 (2013.01); G02F 1/1309 (2013.01); G02F 1/133345 (2013.01); G02F 1/1523 (2013.01); G02F 1/1524 (2019.01); G02F 1/1533 (2013.01); G02F 1/155 (2013.01); H01J 37/32 (2013.01); H01J 37/32733 (2013.01); H01J 37/32853 (2013.01); H01J 37/3417 (2013.01); H01J 37/3429 (2013.01); G02F 1/1316 (2021.01); G02F 2001/1536 (2013.01); G02F 2001/1555 (2013.01);
Abstract
Electrochromic devices are fabricated using a particle removal operation that reduces the occurrence of electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, the particle removal operation is not a lithiation operation. In some embodiments, the particle removal operation is performed at an intermediate stage during the deposition of either an electrochromic layer or a counter electrode layer.