The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Mar. 29, 2023
Applicant:

Siemens Healthineers Digital Technology (Shanghai) Co., Ltd., Shanghai, CN;

Inventors:

Yi-Cheng Hsu, Taipei, TW;

Ying Hua Chu, Taipei, TW;

Patrick Liebig, Erlangen, DE;

Assignee:

Siemens Healthineers AG, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/24 (2006.01); G01R 33/50 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/246 (2013.01); G01R 33/50 (2013.01); G01R 33/5659 (2013.01);
Abstract

A method and device for radio-frequency field inhomogeneity correction in magnetic resonance imaging. The method includes: obtaining a first MR image by scanning a target tissue using a first pulse sequence; obtaining a Bfield map of the target tissue; obtaining a B: field map of the target tissue based on the first MR image and the Bfield map; and performing B1 field inhomogeneity correction on a second MR image of the target tissue based on the Bfield map and the Bfield map, where the second MR image is an MR image obtained after scanning of the target tissue using any imaging protocol and any pulse sequence.


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