The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Dec. 24, 2020
Applicant:

Kabushiki Kaisha Nihon Micronics, Tokyo, JP;

Inventors:

Michitaka Okuta, Tokyo, JP;

Yuki Saito, Tokyo, JP;

Jukiya Fukushi, Aomori, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/067 (2006.01); G01R 1/07 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2863 (2013.01); G01R 1/06733 (2013.01); G01R 1/071 (2013.01);
Abstract

An optical probe includes a core part and a clad part arranged along an outer circumference of the core part, and has an incident surface having a radius of curvature R through which an optical signal enters. The radius of curvature R and a central half angle ω at an incident point of the optical signal on the incident surface fulfil the following formulae using a radiation angle γ of the optical signal, an effective incident radius Se of the optical signal transmitted in the core part without penetrating into the clad part on the incident surface, a refractive index n(r) of the core part at the incident point, and a refracting angle β at the incident point:/sin(ω)ω=±sin2/(12)]}where1=()×cos(β)−cos(γ/2) and2=()×sin(β)−sin(γ/2).


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