The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Feb. 14, 2021
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A method for software-based planning of a dimensional measurement of a measurement object includes receiving an input command for selecting at least one measurement element of the measurement object that is to be measured during the measurement. The method includes determining a selection of measurable test features of the at least one selected measurement element. Each of the test features includes a dimensionally measurable measurand of the at least one selected measurement element. The method includes determining a reduced subset of the selection of measurable test features depending on a view currently chosen on a display. The method includes visualizing the test features contained in the reduced subset by generating a graphical representation of each of the test features contained in the reduced subset on the display.