The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Mar. 28, 2022
Applicant:

Agilent Technologies, Inc., Santa Clara, CA (US);

Inventors:

Kyle Robert Busch, Karlsruhe, DE;

Uwe Effelsberg, Karlsruhe, DE;

Assignee:

Agilent Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/56 (2006.01); G01N 30/16 (2006.01); G01N 30/80 (2006.01); G01N 30/86 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8658 (2013.01); G01N 30/16 (2013.01); G01N 30/80 (2013.01); G01N 30/8665 (2013.01); G01N 2030/027 (2013.01);
Abstract

A process which, on the basis of a provided test sample including a mix of a plurality of pre-known sample components and on the basis of provided absolute sample separation properties for each of the sample components, includes experimentally determining a real sample separation result by executing a sample separation method for separating the test sample by a sample separation apparatus, and determining a real value of at least one operation parameter based on a comparison between the absolute sample separation properties and the real sample separation result for characterizing a real course of the sample separation method.


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