The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Dec. 07, 2021
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventor:

Shinya Ito, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/32 (2006.01); B01D 15/16 (2006.01); G01N 30/02 (2006.01);
U.S. Cl.
CPC ...
G01N 30/32 (2013.01); B01D 15/163 (2013.01); G01N 2030/027 (2013.01); G01N 2030/326 (2013.01);
Abstract

A method of controlling a liquid chromatograph that estimates the maximum value of the pressure reached during measurement before actually measuring a sample. The method includes a pump having a gradient function that feeds liquid while changing the composition of a plurality of eluents, according to gradient liquid feeding conditions, a sample filling unit for filling a sample, a separation column, an analysis flow channel connecting the pump to the separation column, and a pressure sensor which detects a pressure within the analysis flow channel during liquid feeding by the pump. A maximum pressure presumed during measurement is calculated based on an initial pressure as a pressure within the analysis flow channel when the pump starts feeding liquid and the gradient liquid feeding conditions and that when the maximum pressure presumed is determined to be a predetermined upper pressure limit, the sample filling is not performed.


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