The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
May. 05, 2022
Applicant:
Varex Imaging Corporation, Salt Lake City, UT (US);
Inventors:
Daniel Shedlock, Knoxville, TN (US);
David T Nisius, Des Plaines, IL (US);
Assignee:
VAREX IMAGING CORPORATION, Salt Lake City, UT (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/203 (2006.01); G01N 23/04 (2018.01); G01N 23/20 (2018.01); G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
G01N 23/203 (2013.01); G01N 23/04 (2013.01); G01N 23/20083 (2013.01); G01T 1/20 (2013.01); G01T 1/2006 (2013.01); G01N 2223/053 (2013.01); G01N 2223/316 (2013.01);
Abstract
An x-ray system, comprising: a backscatter detector, comprising: an x-ray conversion material; a plurality of sensors configured to generate electrical signals in combination with the x-ray conversion material in response to incident x-rays; and a collimator disposed on the x-ray conversion material and including a plurality of partitions extending away from the x-ray conversion material and the sensors and forming a plurality of openings, each opening corresponding to one of the sensors.