The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Apr. 24, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Shoji Yachida, Tokyo, JP;

Keiko Inoue, Tokyo, JP;

Azusa Sawada, Tokyo, JP;

Toshinori Hosoi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/90 (2006.01); G06T 7/20 (2017.01);
U.S. Cl.
CPC ...
G01N 21/90 (2013.01); G06T 7/20 (2013.01);
Abstract

An inspection system includes: a suspended matter detecting and tracking means that detects and tracks suspended matter present in the liquid in the container in chronological images obtained by consecutively imaging the liquid with a camera; a determining and storage controlling means that determines, based on a movement locus of the tracked suspended matter, whether the suspended matter is foreign matter or an air bubble, and stores inspection result information including a result of the determination and information of the movement locus of the suspended matter used as a basis for the determination into a storing means in association with identification information of the container; and a display controlling means that causes a displaying means to display the result of the determination and the information of the movement locus of the suspended matter used as the basis for the determination included by the inspection result information.


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