The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Oct. 24, 2022
University of Southern California, Los Angeles, CA (US);
Chia Wei Hsu, Los Angeles, CA (US);
Zeyu Wang, Los Angeles, CA (US);
Yiwen Zhang, Los Angeles, CA (US);
University of Southern California, Los Angeles, IA (US);
Abstract
A method for multi-spectral scattering-matrix tomography includes a step of splitting an input light signal into an incident light signal and a reference light signal. The sample light signal is directed to a sample in either a reflection configuration or a transmission configuration such that an output light signal includes light scattered from or transmitted through the sample. The incident signal and the reference light signal are directed to a camera angled to allow for amplitude and phase to be calculated by off-axis holography. A total light signal is measured with a camera that is a coherent sum of the reference light signal and the output signal. The total light signal for each light frequency and each incident angle are collected as collected total light signal data. A computing device derives an image of the sample from a calculated reflection matrix or transmission matrix or both of them.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile