The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Jan. 15, 2021
Applicant:

Dxcover Limited, Glasgow, GB;

Inventors:

Mark Hegarty, Glasgow, GB;

Matthew J. Baker, Glasgow, GB;

Holly Butler, Glasgow, GB;

Assignee:

DXCOVER LIMITED, Glasgow, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/3563 (2014.01); C12M 1/26 (2006.01); C12M 1/34 (2006.01); G01N 21/3577 (2014.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); C12M 33/04 (2013.01); C12M 41/46 (2013.01); G01N 21/3577 (2013.01); G01N 2021/3595 (2013.01);
Abstract

A method of detection of a status of cells within a cell culture is described. The method is based on comparing an IR spectrum of a test sample obtained from the cell culture with an IR spectrum of a control sample or samples or with an IR spectrum of a sample or samples obtained at an earlier time point in the cell culture and correlating differences between the spectra with the status of the cells. The status may be classified into healthy or unhealthy. The test sample may or may not contain cells. The test sample may contain cell fragments, cell components or cell media, or may be cell supernatant. The comparison may be performed using a predictive model based on pattern recognition algorithms, such as support vector machines SVM, linear discriminant analysis LDA, principal component discriminant function analysis PC-DFA, neural networks, or random forests). The analysis results may be used to monitor and/or control the cell culturing process.


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