The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Apr. 13, 2023
Leica Mikrosysteme Gmbh, Vienna, AT;
LEICA MIKROSYSTEME GMBH, Vienna, AT;
Abstract
A microtome system for cutting sections from a specimen includes a knife including a knife edge configured to cut a section from the specimen, a knife holder, a specimen holder, an illumination, a first actor, a detector, and a controller. The knife holder and specimen holder are configured to be relatively moveable in a cutting direction. The first actor is configured to cause a rotation of the knife holder or specimen holder about an axis. The illumination is configured to illuminate a gap between a front face of the specimen and the knife edge to generate a light gap. The detector is configured to detect a geometric feature of the light gap. The controller is configured to automatically align, or provide indications to manually align, the knife edge with the front face, by controlling the first actor depending on the detected geometric feature.