The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Oct. 17, 2022
Lawrence Livermore National Security, Llc, Livermore, CA (US);
Ryan Douglas Muir, Livermore, CA (US);
John E. Heebner, San Ramon, CA (US);
Daniel Ernest Mittelberger, Livermore, CA (US);
Lawrence Livermore National Security, LLC, Livermore, CA (US);
Abstract
Methods, systems and devices are described that enable measurement and characterization of complex laser pulses by relying on three interferograms that are measured simultaneously. The described three-phase spectral interferometry (3PSI) can meet the growing demand for optical recorders with long record and 1 ps or finer resolution. An example three-phase interferometric system includes a three-output optical splitter with a first input port to receive the input optical signal, a second input port to receive a reference optical signal with one or more unknown spectral characteristics. The three output ports of the optical splitter produce interferograms that correspond to relative phase shifts of substantially 120 degrees. Detectors are positioned to receive and measure the interferograms, which allows determination of the amplitude and phase of the input optical signal with very high accuracy. The described techniques include may improvements in the alignment, calibration and signal retrieval procedures associated with the 3PSI system.