The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Jul. 26, 2019
Calibration method for computer vision system and three-dimensional reference object for use in same
Omron Corporation, Kyoto, JP;
Yoshinori Konishi, Kyoto, JP;
OMRON CORPORATION, Kyoto, JP;
Abstract
A calibration method for performing calibration in a computer vision system using a three-dimensional reference object asymmetric as viewed in any direction and having predetermined dimensions includes calculating, based on three-dimensional shape data about the three-dimensional reference object and three-dimensional measurement data obtained through three-dimensional measurement of the three-dimensional reference object, a position and an orientation of the three-dimensional reference object relative to a measurement unit coordinate system defined for the three-dimensional measurement unit, and calculating a reference-measurement unit transformation matrix representing a coordinate transformation between the measurement unit coordinate system and a reference coordinate system defined for the three-dimensional reference object.