The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Jul. 18, 2023
Ckd Corporation, Aichi, JP;
Utsunomiya University, Tochigi, JP;
Hiroyuki Ishigaki, Aichi, JP;
Tomoru Okada, Aichi, JP;
Ikuo Futamura, Aichi, JP;
Takahiro Mamiya, Aichi, JP;
Yoshio Hayasaki, Tochigi, JP;
CKD CORPORATION, Aichi, JP;
UTSUNOMIYA UNIVERSITY, Tochigi, JP;
Abstract
A three-dimensional measurement device includes: an optical system including an optical device that splits an incident light, irradiates a measurement object with a measurement light, irradiates a reference plane with a reference light, and combines at least part of the reflected measurement light with at least part of the reflected reference light to emit a combined light; a first light emitter that emits a first light that has a first wavelength; a second light emitter that emits a second light that has a second wavelength; a first imaging device that takes an image of an output light output from the optical device in which the first light enters; a second imaging device that takes an image of an output light output from the optical device in which the second light enters; and a control device that executes three-dimensional measurement of the measurement object.