The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Mar. 15, 2021
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Damian Pablo San Roman Alerigi, Al-Khobar, SA;

Weichang Li, Katy, TX (US);

Sameeh Issa Batarseh, Dhahran, SA;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/24 (2006.01); E21B 47/002 (2012.01); E21B 49/00 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
E21B 47/0025 (2020.05); E21B 49/00 (2013.01); G01N 21/47 (2013.01); G01N 33/24 (2013.01); G01N 2021/4709 (2013.01); G01N 2021/4792 (2013.01);
Abstract

Some implementations of the present disclosure provide a method that includes: irradiating a target surface with a process beam during a drilling process; in response to irradiating with the process beam, receiving a signal beam that contains light scattered from the target surface as well as light radiating from the target surface; splitting the signal beam into a first portion on a polarization arm and a second portion on a non-polarization arm; performing, on the polarization arm, a first plurality of polarization-dependent intensity and spectrum measurements of the first portion; performing, on the non-polarization arm, a second plurality of intensity and spectrum measurements of the second portion; and based on applying one or more machine learning techniques to at least portions of (i) the first plurality of polarization-dependent intensity and spectrum measurements, and (ii) the second plurality of intensity and spectrum measurements, determining a classification of the target surface.


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