The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Nov. 17, 2022
Applicant:

Path Robotics, Inc., Columbus, OH (US);

Inventors:

Alexander Lonsberry, Gahanna, OH (US);

Andrew Lonsberry, Columbus, OH (US);

Nima Ajam Gard, Columbus, OH (US);

Madhavun Candadai Vasu, Columbus, OH (US);

Eric Schwenker, Columbus, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 9/16 (2006.01); B25J 11/00 (2006.01); B25J 19/02 (2006.01);
U.S. Cl.
CPC ...
B25J 9/1664 (2013.01); B25J 9/161 (2013.01); B25J 9/163 (2013.01); B25J 11/005 (2013.01); B25J 19/021 (2013.01);
Abstract

This disclosure provides systems, methods, and apparatuses, including computer programs encoded on computer storage media, that provide for training, implementing, or updated machine learning logic, such as an artificial neural network, to model a manufacturing process performed in a manufacturing robot environment. For example, the machine learning logic may be trained and implemented to learn from or make adjustments based on one or more operational characteristics associated with the manufacturing robot environment. As another example, the machine learning logic, such as a trained neural network, may be implemented in a semi-autonomous or autonomous manufacturing robot environment to model a manufacturing process and to generate a manufacturing result. As another example, the machine learning logic, such as the trained neural network, may be updated based on data that is captured and associated with a manufacturing result. Other aspects and features are also claimed and described.


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