The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

May. 09, 2023
Applicant:

Proprio, Inc., Seattle, WA (US);

Inventors:

Nava Aghdasi, Jr., Kirkland, WA (US);

James Andrew Youngquist, Seattle, WA (US);

Assignee:

Proprio, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 34/20 (2016.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 34/20 (2016.02); A61B 90/39 (2016.02); A61B 2034/2065 (2016.02); A61B 2090/3937 (2016.02); A61B 2560/0233 (2013.01);
Abstract

Methods and systems for calibrating an instrument, such as a surgical instrument, within an imaging system are disclosed herein. In some embodiments, a method includes capturing images of the instrument with a plurality of cameras of the imaging system and identifying common features of the instrument in the captured images. The method further includes generating a three-dimensional (3D) representation of the instrument based on the common features and determining a reference frame of the instrument based on the generated 3D representation of the instrument. A first transform is determined between the reference frame of the instrument and a reference frame of the cameras. Then, a second transform between the reference frame of the instrument and a reference frame of the tracking structure can be determined based on the first transform.


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