The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 15, 2025

Filed:

Feb. 08, 2023
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Masaaki Oosake, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 1/00 (2006.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
A61B 1/00009 (2013.01); A61B 1/00045 (2013.01); G06N 3/08 (2013.01); G06T 2207/20084 (2013.01);
Abstract

There are provided a learning apparatus, a learning method, a program, a trained model, and an endoscope system that can perform efficient learning even when the learning is performed using pieces of data acquired under conditions different from each other. A learning apparatus includes a hierarchical network including a first input layer, a second input layer, a first intermediate layer, a first normalization layer, a second normalization layer, a second intermediate layer, and an output layer. A learning control unit of the learning apparatus causes first learning and second learning to be performed. In the first learning, a to-be-trained model is trained based on a first error between a first recognition result and a correct answer for first data. In the second learning, the to-be-trained model is trained based on a second error between a second recognition result and a correct answer for second data.


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