The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Jul. 08, 2020
Cognex Corporation, Natick, MA (US);
Jose Fernandez Dorado, Aachen, DE;
Esther Oteo Lozano, Aachen, DE;
Pablo Garcia Campos, Aachen, DE;
Laurens Nunnink, Simpleveld, NL;
Cognex Corporation, Natick, MA (US);
Abstract
This invention provides a system and method for enhanced depth of field (DOF) advantageously used in logistics applications, scanning for features and ID codes on objects. It effectively combines a vision system, a glass lens designed for on-axis and Scheimpflug configurations, a variable lens and a mechanical system to adapt the lens to the different configurations without detaching the optics. The optics can be steerable, which allows it to adjust between variable angles so as to optimize the viewing angle to optimize DOF for the object in a Scheimpflug configuration. One, or a plurality, of images can be acquired of the object at one, or differing angle settings, with the entire region of interest clearly imaged. In another implementation, the optical path can include a steerable mirror and a folding mirror overlying the region of interest, which allows different multiple images to be acquired at different locations on the object.