The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Jun. 23, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Florian Ramian, Karlsfeld, DE;

Alexander Roth, Dorfen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/21 (2015.01); H04B 17/00 (2015.01);
U.S. Cl.
CPC ...
H04B 17/21 (2015.01); H04B 17/0085 (2013.01);
Abstract

A measurement application device calibration unit, system, and method includes at least one coupling element comprising a first and second connections for coupling the coupling element into a signal measurement path that is coupled to a measurement application device, and a third connection, wherein the coupling element is configured to at least one of couple out a signal from the signal measurement path into the third connection, and couple in a signal from the third connection into the signal measurement path, and a signal processing device that is coupled to the third connection of the coupling element and that is configured to receive a predetermined calibration signal when the coupling element couples out a signal from the signal measurement path into the third connection, and to generate a predetermined known calibration signal when the coupling element couples in a signal from the third connection into the signal measurement path.


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