The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Mar. 27, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yuka Ogino, Tokyo, JP;

Takahiro Toizumi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 40/18 (2022.01); G06V 10/26 (2022.01); G06V 10/60 (2022.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G06V 40/193 (2022.01); G06V 10/26 (2022.01); G06V 10/60 (2022.01); H04N 23/56 (2023.01);
Abstract

An image processing system includes a detection unit, an identification unit, and a feature extraction unit. The detection unit detects, from a first image in which a target person is captured, a candidate region being an image region estimated to represent an eye of the target person, based on a first evaluation value. The identification unit identifies, from the detected candidate region, an eye region being an image region that represents the eye, based on a second evaluation value. The feature extraction unit extracts a feature value of the identified eye region. The first evaluation value indicates a likelihood of the eye, and is calculated for an image region being set based on the first image. The second evaluation value indicates a likelihood of the eye, and is calculated for an image region being set based on the detected candidate region.


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