The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Apr. 13, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Ryosuke Sakai, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/44 (2022.01); G06T 7/68 (2017.01); G06T 7/73 (2017.01); G06V 20/70 (2022.01);
U.S. Cl.
CPC ...
G06V 10/44 (2022.01); G06T 7/68 (2017.01); G06T 7/73 (2017.01); G06V 20/70 (2022.01);
Abstract

An information processing deviceincludes a feature point acquiring meansA and a label determining meansA. The feature point acquiring meansA is configured to acquire, based on a captured image 'Im' captured by an imaging unitA, a combination of positions of feature points of a symmetrical object with a symmetry and second labels defined to integrate or change first labels that are unique labels of the feature points based on the symmetry of the symmetrical object. The label determination meansA is configured to determine a first label to be assigned to each of the feature points based on additional information to break the symmetry and the second labels.


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