The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Jan. 21, 2022
Baker Hughes Holdings Llc, Houston, TX (US);
Dang Hai Tran Vu, Bad Oeynhausen, DE;
Alexander Suppes, Hürth, DE;
Baker Hughes Holdings LLC, Houston, TX (US);
Abstract
A method for detecting structures is provided. The method can include receiving inspection image data characterizing a region of interest of an object being inspected. The regions of interest can include one or more structures of the object. The method can also include determining, using a computer vision algorithm, a structure within the region of interest with respect to photometric properties of pixel data in the inspection image data. The structure can be determined using a predictive model trained to determine image filter parameter values for image filters of the computer vision algorithm based on applying optimization techniques using training image data and annotation data. An indication of the structure can be provided, for example for display or storage in memory. Systems and computer-readable mediums implementing the method are also provided.