The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Aug. 11, 2022
Tomocube, Inc., Daejeon, KR;
Hyunseok Min, Daejeon, KR;
Dongmin Ryu, Daejeon, KR;
Woonsoo Lee, Daejeon, KR;
Hansol Yoon, Daejeon, KR;
Tomocube, Inc., Yuseong-gu, KR;
Abstract
The present disclosure provides a system and method for improving image resolution of a three-dimensional (3-D) refractive index microscope based on an artificial intelligence (AI) technology. The present disclosure provides a technology for converting a low-resolution 3-D refractive index microscope image into a high-resolution 3-D refractive index image without physical machine conversion and re-photographing based on AI. That is, the present disclosure applies an AI technology, such as deep learning, in order to train an AI model with a physical correlation between a low-resolution 3-D refractive index microscope image and a high-resolution 3-D refractive index image of various samples, such as a cell and a tissue, and convert a low resolution image into a high resolution image without a change in a physical microscope based on the training. Furthermore, for the training of the AI model, the present disclosure uses physical characteristics of a refractive index image.