The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Jun. 27, 2022
Amazon Technologies, Inc., Seattle, WA (US);
Pierre-Alain Langlois, Vincennes, FR;
Frederic Laurent Pascal Devernay, Bellevue, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
A method is disclosed to automatically detect overhangs from images with depth taken around an object during a scan of the object. An overhang detector can use an intersection of three filters based on these images and depth data associated with the images. The first filter looks for negative depth gradients along a 2D projection of a gravity vector, which is generally a vertical axis for images taken using a portrait orientation. The second filter selects the depth gradients that are oriented towards the projection of the gravity vector. The third filter is a salient object detection mask computed from the image. An intersection of the three filters can then be used to obtain overhangs. The method can be implemented in real time with a User Interface (UI) directing a user of a location of the overhang so that an image below the overhang can be taken.