The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Apr. 01, 2022
Applicant:

Korea Advanced Institute of Science and Technology, Daejeon, KR;

Inventors:

JongChul Ye, Daejeon, KR;

Gyutaek Oh, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); A61B 5/055 (2006.01); G01R 33/44 (2006.01); G01R 33/56 (2006.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); A61B 5/055 (2013.01); G01R 33/443 (2013.01); G01R 33/5608 (2013.01); G06N 3/08 (2013.01);
Abstract

Disclosed is a quantitative susceptibility mapping image processing method using an unsupervised learning-based neural network and an apparatus therefor. The quantitative susceptibility mapping image processing method includes receiving a phase image and a magnitude image for reconstructing the quantitative susceptibility mapping image, and reconstructing the quantitative susceptibility mapping image corresponding to the received phase image and the received magnitude image using an unsupervised learning-based neural network, and the neural network may be generated based on an optimal transport theory.


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