The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Aug. 03, 2022
Applicant:

Realtek Semiconductor Corp., Hsinchu, TW;

Inventors:

Cheng-Chen Huang, Hsinchu, TW;

Chun-Chuan Kuo, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/3308 (2020.01); G06F 30/367 (2020.01); G06F 30/373 (2020.01); G06F 30/392 (2020.01); G06F 30/394 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/367 (2020.01); G06F 30/392 (2020.01); G06F 30/3308 (2020.01); G06F 30/373 (2020.01); G06F 30/394 (2020.01);
Abstract

An optimizing method, device and non-transient computer readable medium for an integrated circuit layout are provided. The method includes: identifying power rails and corresponding power supply domains in an integrated circuit design file; performing design rule check for circuit units in the integrated circuit design file to calculate a plurality of usable regions; determining electromigration violation points corresponding to the power rails and related current information; defining, according to the electromigration violation points and the current information, paths to be corrected on the power rails corresponding to the electromigration violation points; replacing types of vias on the power rails that do not overlap with the paths to be corrected; and correcting a number of the vias on the power rails that overlap with the paths to be corrected to reduce a number of the electromigration violation points.


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Huang, Cheng-Chen. (2025). Optimizing method, device and non-transient computer readable medium for integrated circuit layout (U.S. Patent No. 12353818). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12353818

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