The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Jul. 07, 2022
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Satish Kumar Mopur, Bangalore, IN;
Krishnaprasad Lingadahalli Shastry, Bangalore, IN;
Hewlett Packard Enterprise Development LP, Spring, TX (US);
Abstract
Bias in Machine Learning (ML) is when an ML algorithm tends to incompletely learn relevant and important patterns from a dataset, or learns the patterns from data incorrectly. Such inaccuracy can cause the algorithm to miss important relationships between patterns and features in data, resulting in inaccurate algorithm predictions. Systems and methods for detecting potential ML bias in input image datasets are described herein. After a target image is received, a subset of images related to the target image is extracted. The target image and subset of images are analyzed under an imbalance assessment and data bias assessment to determine the presence of any potential data bias in a ML training pipeline. If any data bias is determined, one or more messages summarizing the assessments and including explanations to enable more accurate predictions in image assessments are sent to the user.