The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Jan. 28, 2022
Tableau Software, Llc, Seattle, WA (US);
Andrew C. Beers, Seattle, WA (US);
Eric Roy Brochu, Vancouver, CA;
Rachel Stern Kalmar, Cambridge, MA (US);
Hon To Ming, Vancouver, CA;
David John Mosimann, New Westminster, CA;
Leiling Tao, Burnaby, CA;
Lu Yu, New Westminster, CA;
Tableau Software, LLC, Seattle, WA (US);
Abstract
Embodiments are directed to managing visualizations of data. Visualizations to monitor may be determined based on metrics associated with the monitored visualizations. Mark values may be sampled from each monitored visualization such that the sampled mark values may be stored with a timestamp. If an amount of the sampled mark values for a monitored visualization exceeds a threshold value mark models may be trained to classify a portion of the sampled mark values associated with the monitored visualization such that the mark models may predict ranges of values for the classified mark values associated with the monitored visualization. If the portion of the classified mark values associated with the monitored visualization has a value outside of the predicted range values, indicating that the monitored visualization may be associated with an anomalous mark value.