The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Jan. 02, 2025
Applicants:

Douyin Vision Co., Ltd., Beijing, CN;

East China Normal University, Shanghai, CN;

Inventors:

Haoyu Wang, Beijing, CN;

Yuxing Han, Beijing, CN;

Chengcheng Yang, Shanghai, CN;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 9/445 (2018.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 16/21 (2019.01); G06F 9/445 (2013.01); G06N 20/00 (2019.01);
Abstract

Embodiments of the present disclosure provide a method and apparatus for estimating a number of distinct values in a database system, a device, and a medium. The method includes: reading and loading, from a distributed file system, a model for NDV estimation into a kernel of the database system; generating feature data of sample data of a target column in the database system; determining, using the model that has been loaded into the kernel, an estimated NDV for the target column based on the feature data; and storing the estimated NDV of the target column for use by the kernel of the database system.


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