The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Dec. 16, 2024
Fmr Llc, Boston, MA (US);
Subhash Saxena, Miyapur, IN;
Nitin Shirsat, Cary, NC (US);
Srikara Uplady Manjunatha, Bengaluru, IN;
Boris Kalinichenko, Jamaica Plain, MA (US);
FMR LLC, Boston, MA (US);
Abstract
Techniques are provided for automatically generating and executing chaos tests for different software applications in a computing environment. A chaos testing data structure can be generated based on an analysis of configuration and/or property files for the software application and/or hosting platform service provider. A pattern and other information from the chaos data structure can be used to determine a topology of the software application and determine defined paths to different identified potential points of failure. One or more components can be selected for the defined paths to the identified potential points of failure. A chaos test template can be selected and automatically populated for each selected component. One or more chaos tests can be executed using the populated chaos test templates to identify one or more vulnerabilities/weaknesses, determine one or more recommendations to improve the vulnerabilities/weaknesses, and/or automatically implement one or more remediations to improve the vulnerabilities/weaknesses.