The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Sep. 01, 2020
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

Farhana Bandukwala, San Clemente, CA (US);

Georg Matthias Goerg, Long Island City, NY (US);

Samuel Paul Ruth, Bethesda, MD (US);

Jonathan Jesse Halcrow, Atlanta, GA (US);

Assignee:

GOOGLE LLC, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 11/3604 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3616 (2013.01);
Abstract

A method of identifying a contributing cause of an anomaly including receiving a set of timeseries data representing metric values over time, wherein the timeseries data has at least two dimensions, for each of two or more of the timestamps in the set of timeseries data, generating a first and second graph representing (i) the metric values at that timestamp, (ii) the at least two dimensions at that timestamp, and (iii) associations between the metric values at that timestamp, analyzing the first and second graphs associated with each timestamp to identify a particular timestamp including an anomaly, and analyzing the first and second graphs associated with the identified particular timestamp to identify a node that contributed in causing the anomaly.


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