The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Sep. 16, 2022
Applicant:

Agc Inc., Tokyo, JP;

Inventors:

Hideaki Takahoshi, Tokyo, JP;

Kazuya Takemoto, Tokyo, JP;

Keisuke Kawai, Tokyo, JP;

Assignee:

AGC Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/28 (2006.01); G02B 5/20 (2006.01);
U.S. Cl.
CPC ...
G02B 5/282 (2013.01); G02B 5/208 (2013.01);
Abstract

An optical filter, including: a substrate; and a dielectric multilayer film laid on or above at least one major surface of the substrate, the dielectric multilayer film including at least two different layers, where: the dielectric multilayer film includes a film having a spin density of 5.0×10/nm·cmor larger, a surface on a dielectric multilayer film side has a nanoindentation hardness of 5.5 GPa or higher when a measurement load is 1 mN, a maximum transmittance at an incident angle of 0° in a wavelength range of 400 nm to 680 nm is 6% or lower, a maximum reflectance at an incident angle of 5° in the wavelength range of 400 nm to 680 nm is 20% or lower, and an average transmittance at an incident angle of 0° in at least one wavelength range having a width of 50 nm is 90% or higher.


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