The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Oct. 07, 2020
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
George Themelis, Lindau, DE;
Leica Instruments (Singapore) Pte Ltd., Singapore, SG;
Abstract
Examples relate to a microscope, and to an apparatus, method and computer program for a microscope. The microscope comprises a light emission module for providing illumination for a sample of organic tissue in a plurality of wavelength bands. The microscope comprises one or more imaging sensor modules configured to independently sense light in a plurality of mutually separated wavelength bands of the plurality of wavelength bands. The microscope comprises a processing module configured to control the light emission module such, that in a first operating mode light in a first subset of the plurality of wavelength bands is emitted towards the sample of organic tissue, and that in a second operating mode light in a second subset of the plurality of wavelength bands is emitted towards the sample of organic tissue. The first and second subset of wavelength bands are at least partially different. The processing module is configured to use the one or more imaging sensor modules to perform reflectance imaging and fluorescence imaging in each of the plurality of mutually separated wavelength bands based on the light emitted in the first and second operating modes.