The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Nov. 20, 2020
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Tetsuro Kuwayama, Tokyo, JP;

Hirokazu Tatsuta, Tokyo, JP;

Gakuji Hashimoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/08 (2006.01); G01J 3/02 (2006.01); G01J 3/04 (2006.01); G01J 3/18 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G02B 21/082 (2013.01); G01J 3/0208 (2013.01); G01J 3/04 (2013.01); G01J 3/18 (2013.01); G01J 3/2823 (2013.01); G01J 2003/045 (2013.01);
Abstract

A microscope device includes an opening () that includes a first slit and a second slit through which a plurality of pieces of light from an observation target resulting from a plurality of pieces of irradiation light emitted to the observation target and having different wavelengths pass, a dispersion element that wavelength-disperses the plurality of pieces of light passing through the opening (), and an imaging element () that receives the plurality of pieces of light wavelength-dispersed by the dispersion element. The imaging element () performs light reception so that, as for the plurality of pieces of light wavelength-dispersed, zeroth-order light of light passing through the second slit and first-order light of light passing through the first slit do not overlap with each other.


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