The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Nov. 29, 2023
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventor:

Mario Zeller, Erlangen, DE;

Assignee:

Siemens Healthineers AG, Forchheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/483 (2006.01); G01R 33/561 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/5611 (2013.01); G01R 33/4835 (2013.01); G01R 33/565 (2013.01);
Abstract

A method for driving a MRI system to generate MRI data of an examination subject may include performing an accelerated echoplanar imaging with an undersampling according to a pulse sequence diagram to acquire k-space data. The pulse sequence diagram may have a plurality of repetitions respectively including: a first sampling diagram configured for an acquisition of k-space data for Nyquist ghost correction, or to generate magnetic field maps, a subsequent second sampling diagram configured for an accelerated echoplanar acquisition, and an excitation diagram that is common to both acquisitions. The first sampling diagram of a real subset of the plurality of repetitions may be modified to: supplement the acquired k-space data using a supplementation of k-space data missing due the undersampling, and/or correct image space of artifacts occurring due to the undersampling based on the k-space data acquired with the modified first sampling diagram.


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