The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Jul. 29, 2024
Applicant:

Honeywell Federal Manufacturing & Technologies, Llc, Kansas City, MO (US);

Inventors:

Daniel Benjamin Hartley, Holden, MO (US);

Jaime Eduardo Regis, Overland Park, KS (US);

Ryan John Eickbush, Lee+3 s Summit, MO (US);

Bill Capen, Raymore, MO (US);

Jason Bradley Edgar, Potosi, MO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B33Y 80/00 (2015.01); B33Y 10/00 (2015.01); G01R 31/28 (2006.01); H05K 1/02 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2818 (2013.01); B33Y 10/00 (2014.12); B33Y 80/00 (2014.12); H05K 1/0268 (2013.01);
Abstract

Systems and methods for testing platforms using additive manufacturing techniques. A testing platform may include an electrical device configured to maintain an electrical connection with one or more additional electrical devices. A testing platform may include one or more connection pads configured to establish a secondary electrical connection between the electrical device and an external testing system. A testing platform may include a testing pattern usable by the external testing system, the testing pattern comprising: one or more printed traces, the one or more printed traces formed from a material deposited via an additive manufacturing technique, wherein the one or more printed traces are located between the electrical device and the one or more additional electrical devices.


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