The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Apr. 12, 2023
Applicant:

Guangzhou University, Guangzhou, CN;

Inventors:

Yanhan Zeng, Guangzhou, CN;

Haochang Zhi, Guangzhou, CN;

Yongnan Chen, Guangzhou, CN;

Junkai Chen, Guangzhou, CN;

Jingci Yang, Guangzhou, CN;

Tianxian Wu, Guangzhou, CN;

Assignee:

Guangzhou University, Guangzhou, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
G01R 27/2605 (2013.01);
Abstract

A capacitance measurement circuit includes an analog front-end (AFE) circuit with current mirror circuits, a parasitic capacitor, an AD converter, an output shift register, and a controller. The controller disconnects a capacitor to be measured and connects one current mirror circuit to record an AFE output voltage Vcollected at an inverting input terminal of the AD converter, then connects the capacitor to be measured to collect an AFE output voltage Vat a non-inverting input terminal of the AD converter, and converts a value of (V−V) into a first digital signal; determines, based on the value of the first digital signal, a connection number m of the current mirror circuits, controls the analog front-end circuit to connect m current mirror circuits, and repeat the steps to obtain a second digital signal; and shift the second digital signal based on the connection number m to obtain a capacitance measurement value.


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