The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Feb. 15, 2023
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Wolfgang Wendler, Munich, DE;

Gregor Feldhaus, Munich, DE;

Florian Ramian, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/16 (2006.01);
U.S. Cl.
CPC ...
G01R 23/16 (2013.01);
Abstract

A detector circuit for a measurement instrument is described. The detector circuit includes a first signal input, a second signal input, and an averaging sub-circuit. The first signal input is configured to receive a first complex-valued measurement signal associated with an input signal received from a device under test. The second signal input is configured to receive a second complex-valued measurement signal associated with the input signal received from the device under test. The averaging sub-circuit is configured to determine an average of the first complex-valued measurement signal and of a complex conjugate of the second complex-valued measurement signal over a predetermined number of samples, thereby obtaining a complex-valued average signal. The averaging sub-circuit is configured to generate an output signal based on the complex-valued average signal. Further, a signal processing circuit and a measurement instrument are described.


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