The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Aug. 04, 2021
Kit for measuring measurement target substance and method for measuring measurement target substance
Fujifilm Corporation, Tokyo, JP;
Yoshinori Kanazawa, Ashigarakami-gun, JP;
Kazuhei Kaneko, Ashigarakami-gun, JP;
Kouitsu Sasaki, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An object of the present invention is to provide a kit for measuring a measurement target substance and a method for measuring a measurement target substance, which can exhibit a high noise suppression effect. According to the present invention, there is provide a kit for measuring a measurement target substance in a biological sample, which includes a luminescently labeled particle that has a first binding substance having a binding property to a measurement target substance, a substrate that has a detection area on a metal film having a second binding substance having a binding property to any one of the measurement target substance or the first binding substance, and a non-luminescent high molecular particle containing a predetermined structural unit.