The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Sep. 18, 2020
Applicant:
Matthew Hummer, Atlantic Beach, FL (US);
Inventor:
Matthew Hummer, Atlantic Beach, FL (US);
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/12 (2006.01); G01D 21/02 (2006.01);
U.S. Cl.
CPC ...
G01N 33/12 (2013.01); G01D 21/02 (2013.01);
Abstract
A system and method for measuring chemicals, analytes or other factors in food. The present invention relates to invasive transcutaneous measurement and minimally-invasive or non-invasive transdermal measurement of chemicals and analytes related to spoilage and contamination in a consumable host, primarily seafood and meat as well as other perishable foods. The invention also measures and monitors other factors including temperature, humidity, pH, moisture and location.
Quick Actions:
Hummer, Matthew. (2025). System and method for measuring chemicals, analytes and other factors in food (U.S. Patent No. 12352737). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12352737
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile