The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Mar. 04, 2024
Applicant:

New York University, New York, NY (US);

Inventors:

Alexej Jerschow, New York, NY (US);

Andrew J. Ilott, Belle Mead, NJ (US);

Mohaddese Mohammadi, Brooklyn, NY (US);

Emilia Silletta, Cordoba, AR;

Konstantin Romanenko, New York, NY (US);

Assignee:

NEW YORK UNIVERSITY, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 24/08 (2006.01); G01N 24/10 (2006.01); G01R 31/36 (2020.01); G01R 33/56 (2006.01);
U.S. Cl.
CPC ...
G01N 24/08 (2013.01); G01N 24/10 (2013.01); G01R 31/3644 (2013.01); G01R 33/5602 (2013.01); G01R 33/5608 (2013.01);
Abstract

A method of diagnosing a conducting structure includes providing the conducting structure in a magnetic field, immersing the conducting structure in a detection medium, or placing a detection medium in the vicinity of the conducting structure, exciting nuclear or electronic spins within the detection medium using a broad-band excitation pulse, receiving an NMR or ESR spectrum from the detection medium, obtaining a frequency distribution of the detection medium, and indirectly measuring internal characteristics of the conducting structure by characterizing frequency changes in the frequency distribution. Conducting structures are analyzed on the basis of changes in magnetic susceptibilities and internal electric current distributions, which may change over the course of a charging/discharging cycle, and a result of degradation and failure of the conducting structure. The conducting structure may be, for example, a battery, a capacitor, a supercapacitor, a fuel cell, or a catalyst material.


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