The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Sep. 17, 2021
Applicant:

Nuctech Company Limited, Beijing, CN;

Inventors:

Li Zhang, Beijing, CN;

Qingping Huang, Beijing, CN;

Mingzhi Hong, Beijing, CN;

Zinan Wang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/04 (2018.01); G01N 23/083 (2018.01);
U.S. Cl.
CPC ...
G01N 23/083 (2013.01); G01N 23/04 (2013.01); G01N 2223/3303 (2013.01);
Abstract

A radiographic inspection device is provided, including: a plurality of inspection channels, a scanning apparatus, a driving apparatus and a controller. The plurality of inspection channels are arranged side by side, and each inspection channel is configured to carry an object to be inspected. The scanning apparatus includes a radiation source mounted outside the plurality of inspection channels, and a receiving apparatus mounted outside the plurality of inspection channels and configured to receive a radiation beam emitted from the radiation source. The driving apparatus is configured to drive the radiation source and the receiving apparatus to move to a vicinity of each inspection channel. The controller is configured to control the scanning apparatus moved to the vicinity of one of the plurality of inspection channels to scan the object in the one of the plurality of inspection channels.


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