The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Dec. 18, 2020
Nidek Co., Ltd., Gamagori, JP;
Katsuyasu Mizuno, Aichi, JP;
Toshihiro Kobayashi, Aichi, JP;
Yujiro Tochikubo, Aichi, JP;
Yuichi Matsubara, Aichi, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
An eyeglasses lens measurement device measures an eyeglasses lens of eyeglasses. The eyeglasses lens measurement device includes a light source that emits a measurement light flux toward the eyeglasses lens, a transmissive display that transmits the measurement light flux from the light source and displays an index pattern formed by arranging a plurality of indexes, a detector that detects the measurement light flux passing through the eyeglasses lens and the transmissive display, and a controller. The controller is configured to control a display of the index pattern, acquire an optical characteristic of the eyeglasses lens, based on a detection result of the detector, and acquire lens information different from the optical characteristic of the eyeglasses lens, based on a detection result of the detector.