The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Mar. 10, 2023
Applicant:

Northwestern Polytechnical University, Shaanxi, CN;

Inventors:

Limin Gao, Shaanxi, CN;

Ning Ge, Shaanxi, CN;

Xiangfu Lei, Shaanxi, CN;

Lei Wang, Shaanxi, CN;

Bo Ouyang, Shaanxi, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 25/00 (2006.01); G01L 1/24 (2006.01); G01N 21/01 (2006.01); G01N 21/71 (2006.01); G01N 21/84 (2006.01); G01L 19/00 (2006.01);
U.S. Cl.
CPC ...
G01L 25/00 (2013.01); G01L 1/24 (2013.01); G01N 21/01 (2013.01); G01N 21/71 (2013.01); G01N 21/8422 (2013.01); G01L 19/0092 (2013.01); G01N 2021/8427 (2013.01);
Abstract

The disclosure discloses a measuring device for dynamic characteristics of pressure sensitive paint, including a PSP sample wafer, a dynamic pressure sensor, an oscilloscope, a light source, a photomultiplier tube, a bandpass filter, a loudspeaker, a power amplifier, and a signal generator. The disclosure further discloses a measuring method for dynamic characteristics of pressure sensitive paint. The disclosure has the following beneficial effects: by using the measuring device disclosed by the present disclosure, the continuous sinusoidal pressure wave with any frequency can be generated, and has the frequency precision that does not exceed 0.01 Hz, an optical path is not shielded, high stability is achieved, and the amplitude and phase characteristics of the pressure frequency of the PSP can be precisely captured.


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