The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Mar. 23, 2022
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventor:

Katsuya Nozawa, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01J 3/44 (2013.01); G01N 21/65 (2013.01); G01J 2003/4424 (2013.01);
Abstract

A Raman spectroscopy device includes: an irradiator that irradiates a sample with first excitation light having a first line width and second excitation light having a line width broader than the first line width; a spectroscopy measurer that, when first measurement light emitted from the sample when the sample is irradiated with the first excitation light and second measurement light emitted from the sample when the sample is irradiated with the second excitation light are incident, performs spectroscopy measurement on the first measurement light and the second measurement light; and a first selective optical system that has a first transmission band and a first stop band, and filters the first measurement light and the second measurement light incident on the spectroscopy measurer. The first excitation light and the second excitation light each have a main component in the first stop band, and the second excitation light has substantially no component in the first transmission band.


Find Patent Forward Citations

Nozawa, Katsuya. (2025). Raman spectroscopy device and raman spectroscopy measurement method (U.S. Patent No. 12352626). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12352626

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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