The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 08, 2025

Filed:

Aug. 22, 2022
Applicant:

Atlantic Inertial Systems Limited, Plymouth, GB;

Inventors:

Christopher Paul Fell, Cheltenham, GB;

Ian Michael Sturland, Bristol, GB;

Tracey Ann Hawke, Bristol, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B81B 3/00 (2006.01); B81C 1/00 (2006.01); G01C 19/5684 (2012.01); G01C 19/5755 (2012.01); G01C 19/5769 (2012.01);
U.S. Cl.
CPC ...
B81B 3/0072 (2013.01); B81C 1/00666 (2013.01); G01C 19/5684 (2013.01); G01C 19/5755 (2013.01); G01C 19/5769 (2013.01); B81B 2201/0242 (2013.01); B81C 2201/013 (2013.01); B81C 2201/0132 (2013.01); B81C 2201/0133 (2013.01); B81C 2201/0143 (2013.01); B81C 2201/0198 (2013.01); B81C 2203/031 (2013.01); B81C 2203/032 (2013.01);
Abstract

A method for forming a MEMS structure for an inertial sensor from fused silica includes: depositing a conductive layer on one or more selected regions of a first surface of a fused silica substrate, and illuminating areas of the fused silica substrate with laser radiation in a pattern defining features of the MEMS structure for an inertial sensor. A masking layer is deposited at least on the one or more selected regions of the first surface of the fused silica substrate where the conductive layer has been deposited, such that the illuminated areas of the fused silica substrate remain exposed. A first etch of the exposed areas of the fused silica substrate is performed so as to selectively etch the pattern defining features of the MEMS structure for an inertial sensor.


Find Patent Forward Citations

Loading…