The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2025
Filed:
Aug. 15, 2023
Applicant:
Essenlix Corporation, Monmouth Junction, NJ (US);
Inventors:
Stephen Y. Chou, Princeton, NJ (US);
Wei Ding, Princeton, NJ (US);
Ji Qi, Hillsborough, NJ (US);
Yufan Zhang, Monmouth Junction, NJ (US);
Assignee:
Essenlix Corporation, Monmouth Junction, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); G01N 1/28 (2006.01); G01N 33/49 (2006.01);
U.S. Cl.
CPC ...
B01L 3/5088 (2013.01); G01N 1/2813 (2013.01); G01N 33/492 (2013.01); B01L 2200/022 (2013.01); B01L 2200/025 (2013.01); B01L 2300/0636 (2013.01); B01L 2300/0816 (2013.01); B01L 2300/0829 (2013.01); B01L 2300/0851 (2013.01); B01L 2300/0887 (2013.01); B01L 2300/123 (2013.01); B01L 2400/0481 (2013.01);
Abstract
One aspect of the present invention is to provide the device and methods for performing an assay that uses the multiplexing of sample thicknesses on the same plate. The sample thickness multiplexing can offer many information that is unavailable in using a single sample thickness.